Solder joint reliability of BGA, CSP, flip chip, and fine pitch SMT assemblies

著者

    • Lau, John H.
    • Pao, Yi-Hsin

書誌事項

Solder joint reliability of BGA, CSP, flip chip, and fine pitch SMT assemblies

John H. Lau, Yi-Hsin Pao

(Electronic packaging and interconnection series)

McGraw-Hill, c1997

  • : hc

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注記

Includes bibliographical references and index

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