Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.
著者
書誌事項
Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.
（Materials Research Society symposium proceedings, v. 466）
Materials Research Society, c1997
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注記
Includes bibliographical references and indexes
内容説明・目次
内容説明
There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.
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