書誌事項
Nanoscience and technology
Springer, c1998-
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注記
Series editor: K[laus] von Klitzing, R[oland] Wiesendanger
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61
- Lateral alignment of epitaxial quantum dots
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Oliver G. Schmidt, [editor]
Springer c2007 Nanoscience and technology
所蔵館7館
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62
- Roadmap of scanning probe microscopy
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S. Morita (ed.)
Springer c2007 Nanoscience and technology
所蔵館5館
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63
- Nanostructures - Fabrication and Analysis
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Hitoshi Nejo(ed.)
Springer Berlin 2007 Nanoscience and technology
所蔵館4館
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64
- Fundamentals of friction and wear
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Enrico Gnecco, Ernst Meyer
Springer c2007 Nanoscience and technology
所蔵館10館
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65
- Nanocatalysis
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U. Heiz, U. Landman (eds.)
Springer c2007 Nanoscience and technology
: pbk
所蔵館12館
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66
- Characterization
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Bharat Bhushan, Satoshi Kawata (eds.)
Springer c2007 Nanoscience and technology . Applied scanning probe methods ; 6
: pbk
所蔵館8館
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67
- Biomimetics and industrial applications
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Bharat Bhushan, Harald Fuchs (eds.)
Springer c2007 Nanoscience and technology . Applied scanning probe methods ; 7
所蔵館7館
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68
- Scanning probe microscopy techniques
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Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)
Springer c2007 Nanoscience and technology . Applied scanning probe methods ; 5
所蔵館7館
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69
- Industrial applications
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Bharat Bhushan, Harald Fuchs (eds.)
Springer c2006 Nanoscience and technology . Applied scanning probe methods ; 4
所蔵館5館
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70
- Characterization
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Bharat Bhushan, Harald Fuchs (eds.)
Springer c2006 Nanoscience and technology . Applied scanning probe methods ; 3
所蔵館8館
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71
- Scanning probe microscopy techniques
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Bharat Bhushan, Harald Fuchs (eds.)
Springer c2006 Nanoscience and technology . Applied scanning probe methods ; 2
所蔵館8館
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72
- Single molecule chemistry and physics : an introduction
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C. Wang, C. Bai
Springer c2006 Nanoscience and technology
所蔵館9館
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73
- Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
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G. Kaupp
Springer c2006 Nanoscience and technology
: pbk
所蔵館9館
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74
- Scanning probe microscopy : atomic scale engineering by forces and currents
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A. Foster, W. Hofer
Springer c2006 Nanoscience and technology
所蔵館8館
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75
- Silicon quantum integrated circuits : silicon-germanium heterostructure devices : basics and realisations
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E. Kasper, D.J. Paul
Springer c2005 Nanoscience and technology
所蔵館1館
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76
- Applied physics of carbon nanotubes : fundamentals of theory, optics and transport devices
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S.V. Rotkin, S. Subramoney (eds.)
Springer c2005 Nanoscience and technology
所蔵館20館
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77
- Magnetic microscopy of nanostructures
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H. Hopster, P. Oepen (eds.)
Springer c2005 Nanoscience and technology
所蔵館11館
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78
- Nanostructures : theory and modeling
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C. Delerue, M. Lannoo
Springer c2004 Nanoscience and technology
所蔵館11館
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79
- Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach
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M. Alexe, A. Gruverman, Eds
Springer c2004 Nanoscience and technology
所蔵館9館
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80
- Applied scanning probe methods
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Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]
Springer c2004 Nanoscience and technology
所蔵館20館