Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.

著者

• Clement, J. Joseph

書誌事項

Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.

editors, J. Joseph Clement ... [et al.]

（Materials Research Society symposium proceedings, v. 473）

Materials Research Society, c1997

注記

Includes index

詳細情報

• NII書誌ID(NCID): BA34715569
• ISBN:
  • 1558993770
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xv, 457 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381
• 件名:
  • LCSH : Microelectronics -- Reliability -- Congresses
  • LCSH : Microelectronics -- Materials -- Testing -- Congresses
  • LCSH : Electrodiffusion -- Congresses
  • LCSH : Microstructure -- Congresses
• 親書誌ID:
  • BA00013775