Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.

Author(s)

• Clement, J. Joseph

Bibliographic Information

Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.

editors, J. Joseph Clement ... [et al.]

（Materials Research Society symposium proceedings, v. 473）

Materials Research Society, c1997

Note

Includes index

Details

• NCID: BA34715569
• ISBN:
  • 1558993770
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: xv, 457 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381
• Subject Headings:
  • LCSH : Microelectronics -- Reliability -- Congresses
  • LCSH : Microelectronics -- Materials -- Testing -- Congresses
  • LCSH : Electrodiffusion -- Congresses
  • LCSH : Microstructure -- Congresses
• Parent Bibliography ID:
  • BA00013775