Proceedings : International Test Conference 1997

Author(s)

• International Test Conference
• IEEE Computer Society

Bibliographic Information

Proceedings : International Test Conference 1997

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference, c1997

• : soft
• : case
• :microfiche
• :CD-ROM

Other Title

ITC : International Test Conference 1997

1997 IEEE International Test Conference

Test and design validity

97CH36126

Note

"November 1-6, 1997, Sheraton Washington Hotel, Washington, D.C. USA"--Cover

"IEEE Catalog Number 97CH36126."--T.p. verso

Includes bibliographies and index

Details

• NCID: BA34937480
• ISBN:
  • 0780342097
  • 0780342100
  • 0780342119
  • 0780342127
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.
• Pages/Volumes: xiv, 1054 p.
• Size: 29 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses