Proceedings : International Test Conference 1997

著者

• International Test Conference
• IEEE Computer Society

書誌事項

Proceedings : International Test Conference 1997

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference, c1997

• : soft
• : case
• :microfiche
• :CD-ROM

タイトル別名

ITC : International Test Conference 1997

1997 IEEE International Test Conference

Test and design validity

97CH36126

注記

"November 1-6, 1997, Sheraton Washington Hotel, Washington, D.C. USA"--Cover

"IEEE Catalog Number 97CH36126."--T.p. verso

Includes bibliographies and index

内容説明・目次

内容説明

The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them. This text covers the 1996 conference.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA34937480
• ISBN:
  • 0780342097
  • 0780342100
  • 0780342119
  • 0780342127
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xiv, 1054 p.
• 大きさ: 29 cm
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses