Handbook of surface and interface analysis : methods for problem-solving
著者
書誌事項
Handbook of surface and interface analysis : methods for problem-solving
Marcel Dekker, c1998
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.
目次
- Elements of problem-solving
- how to use this book
- spectroscopic and spectrometric techniques - x-ray photoelectron spectroscopy (ISS)
- compositional analysis by Auger electron and x-ray photoelectron spectroscopy
- ion beam techniques - surface mass spectrometry
- in-depth analysis - methods for depth profiling
- ion beam effects in thin surface films and interfaces
- surface modification by ion implantation
- introduction to scanned probe microscopy
- metallurgy
- microelectronics and semiconductors
- minerals, ceramics and glasses
- composites
- corrosion and surface analysis - an approach involving spectroscopic and electrochemical methods
- problem-solving methods in tribology with surface specific techniques
- catalyst characterization
- adhesion science and technology
- archaeomaterials
- appendices - physical constants and conversion factors, data for the elements and isotopes, less commonly used techniques for analysis of surfaces and interfaces, core-level binding energies, Auger kinetic energies and modified Auger parameters for some chemical elements in various compounds, documentary standards in surface analysis - the way of the future?.
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