{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA35221134.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA35221134#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA35221134.json"},"dc:title":[{"@value":"A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis"}],"dc:creator":"edited by Victor E. Buhrke, Ron Jenkins, Deane K. Smith","dc:publisher":[{"@value":"Wiley-VCH"}],"dcterms:extent":"xxiv, 333 p.","cinii:size":"25 cm","dc:language":"eng","dc:date":"1998","cinii:ncid":"BA35221134","cinii:ownerCount":"6","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Buhrke, Victor E."}]},{"@id":"https://ci.nii.ac.jp/author/DA02408497#entity","@type":"foaf:Person","foaf:name":[{"@value":"Jenkins, Ron"}]},{"@id":"https://ci.nii.ac.jp/author/DA07600505#entity","@type":"foaf:Person","foaf:name":[{"@value":"Smith, Deane K. (Deane Kingsley)"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA002258","@type":"foaf:Organization","foaf:name":"山梨大学 附属図書館","rdfs:seeAlso":{"@id":"https://opac.lib.yamanashi.ac.jp/opac/opac_openurl?ncid=BA35221134"}},{"@id":"https://ci.nii.ac.jp/library/FA002349","@type":"foaf:Organization","foaf:name":"岐阜大学 図書館","rdfs:seeAlso":{"@id":"https://opac.lib.gifu-u.ac.jp/opc/recordID/catalog.bib/BA35221134"}},{"@id":"https://ci.nii.ac.jp/library/FA002484","@type":"foaf:Organization","foaf:name":"名古屋大学 理学 図書室","rdfs:seeAlso":{"@id":"https://m-opac.nul.nagoya-u.ac.jp/iwjs0023opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA35221134&initFlg=_RESULT_SET_NOTBIB"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA35221134"}},{"@id":"https://ci.nii.ac.jp/library/FA009177","@type":"foaf:Organization","foaf:name":"大学共同利用機関法人 高エネルギー加速器研究機構","rdfs:seeAlso":{"@id":"https://lib-extopc.kek.jp/opac/opac_openurl/?ncid=BA35221134"}},{"@id":"https://ci.nii.ac.jp/library/FA020169","@type":"foaf:Organization","foaf:name":"北九州学術研究都市学術情報センター","rdfs:seeAlso":{"@id":"http://lib.hibikino.ne.jp/webopac/ufirdi.do?ufi_target=ctlsrh&listcnt=20&maxcnt=1000&ncid=BA35221134"}}],"bibo:lccn":["97016687"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/97016687"}],"prism:publicationDate":["c1998"],"cinii:note":["Includes bibliographical references (p. 321-326) and index"],"dc:subject":["LCC:QD96.X2","DC21:543/.08586"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=X-ray+spectroscopy","dc:title":"X-ray spectroscopy"},{"@id":"https://ci.nii.ac.jp/books/search?q=X-ray+crystallography","dc:title":"X-ray crystallography"},{"@id":"https://ci.nii.ac.jp/books/search?q=Sampling+--+Technique","dc:title":"Sampling -- Technique"}],"dcterms:hasPart":[{"@id":"urn:isbn:0471194581"}]}]}