Semiconductor material and device characterization

Author(s)

• Schroder, Dieter K.

Bibliographic Information

Semiconductor material and device characterization

Dieter K. Schroder

（A Wiley-Interscience publication）

Wiley, c1998

2nd ed

Note

Includes bibliographical references and index

Details

• NCID: BA36515684
• ISBN:
  • 0471241393
• LCCN: 97052094
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xxiv, 760 p.
• Size: 25 cm
• Classification:
  • LCC : QC611
  • DC21 : 621.3815/2
  • NDLC : MC151
• Subject Headings:
  • LCSH : Semiconductors
  • LCSH : Semiconductors -- Testing
• Parent Bibliography ID:
  • BA00493885