ISTFA '93 : proceedings of the 19th International Symposium for Testing and Failure Analysis, 15-19 November 1993, Los Angeles, California

著者

• International Symposium for Testing and Failure Analysis
• ASM International. Electronic Materials and Processing Division

書誌事項

ISTFA '93 : proceedings of the 19th International Symposium for Testing and Failure Analysis, 15-19 November 1993, Los Angeles, California

sponsored by the Electronic Materials and Processing Division of ASM International

ASM International, c1993

• NII書誌ID(NCID): BA36548581
• ISBN:
  • 0871704986
• LCCN: 97073500
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, OH
• ページ数/冊数: xi, 436 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871
  • DC20 : 621.381/04
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic appartus and appliances -- Testing -- Congresses