VLSI testing : digital and mixed analogue/digital techniques
著者
書誌事項
VLSI testing : digital and mixed analogue/digital techniques
（IEE circuits, devices and systems series, 9）
Institution of Electrical Engineers, c1998
大学図書館所蔵 件 / 全4件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Bibliography: p. 510-514
Includes index
内容説明・目次
内容説明
The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.
目次
Chapter 1: Introduction
Chapter 2: Faults in digital circuits
Chapter 3: Digital test pattern generation
Chapter 4: Signatures and self test
Chapter 5: Structured design for testability (DFT) techniques
Chapter 6: Testing of structured digital circuits and microprocessors
Chapter 7: Analogue testing
Chapter 8: Mixed analogue/digital system test
Chapter 9: The economics of test and final overall summary
Appendices
「Nielsen BookData」 より
