VLSI testing : digital and mixed analogue/digital techniques

Author(s)

• Hurst, S. L.
• Institution of Electrical Engineers

Bibliographic Information

VLSI testing : digital and mixed analogue/digital techniques

Stanley L. Hurst

（IEE circuits, devices and systems series, 9）

Institution of Electrical Engineers, c1998

Note

Bibliography: p. 510-514

Includes index

Details

• NCID: BA37184301
• ISBN:
  • 0852969015
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: London
• Pages/Volumes: xx, 532 p.
• Size: 24cm
• Classification:
  • DC21 : 621.3950287
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
• Parent Bibliography ID:
  • BA36743292