Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

Author(s)

• Finan, William F.

Bibliographic Information

Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

William F. Finan

（The MIT Japan program : science, technology, management, MITJP 93-01）

Center for International Studies, Massachusetts Institute of Technology, [1993?]

Note

Includes bibliographical references

"Distributed courtesy of the MIT Japan program, science, technology, management"

• NCID: BA37393232
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Cambridge, Mass.
• Pages/Volumes: 31, [7] p.
• Size: 28 cm
• Parent Bibliography ID:
  • BA3728019X