Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

Bibliographic Information

Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

William F. Finan

(The MIT Japan program : science, technology, management, MITJP 93-01)

Center for International Studies, Massachusetts Institute of Technology, [1993?]

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Note

Includes bibliographical references

"Distributed courtesy of the MIT Japan program, science, technology, management"

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Details
  • NCID
    BA37393232
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Cambridge, Mass.
  • Pages/Volumes
    31, [7] p.
  • Size
    28 cm
  • Parent Bibliography ID
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