Interferogram analysis for optical testing
著者
書誌事項
Interferogram analysis for optical testing
（Optical engineering, 61）
Marcel Dekker, c1998
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."
目次
- Review and comparison of major interferometric systems
- Fourier theory review
- digital image processing
- fringe contouring and polynomial fitting
- signal phase detection
- phase detection algorithms
- phase shifting interferometry
- spatial linear and circular carrier analysis
- interferogram analysis with Moire methods
- wavefront slope and curvature tests
- phase unwrapping
- measurement of aspheric wavefronts
- review articles and books.
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