Interferogram analysis for optical testing
著者
書誌事項
Interferogram analysis for optical testing
（Optical engineering, 61）
Marcel Dekker, c1998
大学図書館所蔵 全16件
注記
Includes bibliographical references and index
内容説明・目次
内容説明
"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."
目次
- Review and comparison of major interferometric systems
- Fourier theory review
- digital image processing
- fringe contouring and polynomial fitting
- signal phase detection
- phase detection algorithms
- phase shifting interferometry
- spatial linear and circular carrier analysis
- interferogram analysis with Moire methods
- wavefront slope and curvature tests
- phase unwrapping
- measurement of aspheric wavefronts
- review articles and books.
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