1998 IEEE International Reliability Physics Symposium proceedings : 36th annual, Reno, Nevada, March 31, April 1, 2, 1998

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1998 IEEE International Reliability Physics Symposium proceedings : 36th annual, Reno, Nevada, March 31, April 1, 2, 1998

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1998

• : soft.
• : case.

タイトル別名

98CH36173

注記

Includes bibliographies

"IEEE Catalog No. 98CH36173"

内容説明・目次

内容説明

This text deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics. It covers such topics as: advanced semiconductor devices; failure and yield enhancement analysis; device dielectrics; channel hot carriers; and ESD and latchup.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA37509756
• ISBN:
  • 0780344006
  • 0780344014
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N. J.
• ページ数/冊数: vii, 421 p.
• 大きさ: 28 cm