1998 IEEE International Reliability Physics Symposium proceedings : 36th annual, Reno, Nevada, March 31, April 1, 2, 1998

Author(s)

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

1998 IEEE International Reliability Physics Symposium proceedings : 36th annual, Reno, Nevada, March 31, April 1, 2, 1998

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1998

• : soft.
• : case.

Other Title

98CH36173

Note

Includes bibliographies

"IEEE Catalog No. 98CH36173"

• NCID: BA37509756
• ISBN:
  • 0780344006
  • 0780344014
• LCCN: 82640313
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N. J.
• Pages/Volumes: vii, 421 p.
• Size: 28 cm