Beam effects, surface topography, and depth profiling in surface analysis

著者

• Czanderna, Alvin Warren
• Madey, Theodore E. (...Theodore Eugene...)
• Powell, C. J. (Cedric John)

書誌事項

Beam effects, surface topography, and depth profiling in surface analysis

edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell

（Methods of surface characterization, v. 5）

Plenum, c1998

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA38248159
• ISBN:
  • 0306458969
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York ; London
• ページ数/冊数: xix, 430 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA418.7.B43
  • DC21 : 530.417
• 件名:
  • LCSH : Surfaces (Technology) -- Analysis
• 親書誌ID:
  • BA01237188