Beam effects, surface topography, and depth profiling in surface analysis

Author(s)

• Czanderna, Alvin Warren
• Madey, Theodore E. (...Theodore Eugene...)
• Powell, C. J. (Cedric John)

Bibliographic Information

Beam effects, surface topography, and depth profiling in surface analysis

edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell

（Methods of surface characterization, v. 5）

Plenum, c1998

Note

Includes bibliographical references and index

Details

• NCID: BA38248159
• ISBN:
  • 0306458969
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York ; London
• Pages/Volumes: xix, 430 p.
• Size: 24 cm
• Classification:
  • LCC : TA418.7.B43
  • DC21 : 530.417
• Subject Headings:
  • LCSH : Surfaces (Technology) -- Analysis
• Parent Bibliography ID:
  • BA01237188