Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.

著者

• Ashok, S.

書誌事項

Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.

editors, S. Ashok ... [et al.]

（Materials Research Society symposium proceedings, v. 510）

Materials Research Society, c1998

タイトル別名

Defect and impurity engineered semiconductors and devices, II

注記

Includes bibliographical references and indexes

• NII書誌ID(NCID): BA3837004X
• ISBN:
  • 1558994165
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Warrendale, Pa
• ページ数/冊数: xvii, 679 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00013775