Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.

著者

• Bravman, AJohm C.

書誌事項

Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.

editors, John C. Bravman ... [et al.]

（Materials Research Society symposium proceedings, v. 516）

Materials Research Society, c1998

注記

Includes index

詳細情報

• NII書誌ID(NCID): BA38805823
• ISBN:
  • 155899422X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xi, 365 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381
• 件名:
  • LCSH : Microelectronics -- Reliability -- Congresses
  • LCSH : Microelectronics -- Materials -- Testing -- Congresses
  • LCSH : Electrodiffusion -- Congresses
  • LCSH : Microstructure -- Congresses
• 親書誌ID:
  • BA00013775