X-ray microscopy and spectromicroscopy

著者

• Thieme, Jürgen
• Schmahl, G. (Günter)
• Rudolph, D. (Dietbert)
• Umbach, Eberhard
• International Conference of X-Ray Microscopy and Spectromicroscopy

書誌事項

X-ray microscopy and spectromicroscopy

Jürgen Thieme ... [et al.], (eds.)

Springer, 1998

• : hard

注記

Based on presentation to the International Conference of X-Ray Microscopy and Spectromicroscopy, XRM 96, which took place in Würzburg, August 19-23, 1996

Includes CD-ROM in pocket of back cover ;Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA38909385
• ISBN:
  • 3540639985
• LCCN: 98015577
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xix, 103, 112, 75, 55, 35 p.
• 大きさ: 25 cm
• 分類:
  • LCC : QH212.X2
  • DC21 : 502/.8/2
• 件名:
  • LCSH : X-ray microscopy -- Congresses