High resolution X-ray diffractometry and topography

Author(s)

• Bowen, D. Keith (David Keith)
• Tanner, B. K. (Brian Keith)

Bibliographic Information

High resolution X-ray diffractometry and topography

D. Keith Bowen and Brian K. Tanner

Taylor & Francis, c1998

Note

Includes bibliographical references and index

Details

• NCID: BA39292928
• ISBN:
  • 0850667585
• LCCN: 98136331
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: London
• Pages/Volumes: x, 252 p.
• Size: 26 cm
• Classification:
  • LCC : QD945
  • DC21 : 548/.83
  • DC21 : 548.83
• Subject Headings:
  • LCSH : X-ray crystallography
  • LCSH : X-rays -- Diffraction
  • LCSH : Crystals