{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA3947810X.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA3947810X#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA3947810X.json"},"dc:title":[{"@value":"Reliability and failure of electronic materials and devices"}],"dc:creator":"Milton Ohring","dc:publisher":[{"@value":"Academic Press"}],"dcterms:extent":"xxi, 692 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"1998","cinii:ncid":"BA3947810X","cinii:ownerCount":"6","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA06066952#entity","@type":"foaf:Person","foaf:name":[{"@value":"Ohring, Milton"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001991","@type":"foaf:Organization","foaf:name":"電気通信大学 附属図書館","rdfs:seeAlso":{"@id":"https://www.lib.uec.ac.jp/mylimedio/search/search.do?mode=comp&taget=local&ncid=BA3947810X"}},{"@id":"https://ci.nii.ac.jp/library/FA022120","@type":"foaf:Organization","foaf:name":"京都大学 桂図書館","rdfs:seeAlso":{"@id":"https://kuline.kulib.kyoto-u.ac.jp/opac/opac_openurl/?ncid=BA3947810X"}},{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BA3947810X"}},{"@id":"https://ci.nii.ac.jp/library/FA020442","@type":"foaf:Organization","foaf:name":"宇宙航空研究開発機構 筑波図書室","rdfs:seeAlso":{"@id":"https://opac.std.cloud.iliswave.jp/iwjs0008opc/cattab.do?sp_srh_flg=true&ncid=BA3947810X"}},{"@id":"https://ci.nii.ac.jp/library/FA015475","@type":"foaf:Organization","foaf:name":"滋賀県立大学 図書情報センター","rdfs:seeAlso":{"@id":"http://www.lib.usp.ac.jp/mylimedio/search/search.do?target=local&mode=comp&ncid=BA3947810X"}},{"@id":"https://ci.nii.ac.jp/library/FA016922","@type":"foaf:Organization","foaf:name":"高知工科大学 附属情報図書館","rdfs:seeAlso":{"@id":"https://www-opac.lib.kppuc.ac.jp/mylimedio/search/search.do?target=local&mode=comp&category-mgz=1&category-book=1&annex=all&ncid=BA3947810X"}}],"bibo:lccn":["98016084"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/98016084"}],"prism:publicationDate":["c1998"],"cinii:note":["Includes bibliographical references and index"],"dc:subject":["LCC:TK7870.23","DC21:621.381"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+apparatus+and+appliances+--+Reliability","dc:title":"Electronic apparatus and appliances -- Reliability"},{"@id":"https://ci.nii.ac.jp/books/search?q=System+failures+%28Engineering%29","dc:title":"System failures (Engineering)"}],"dcterms:hasPart":[{"@id":"urn:isbn:0125249853"}]}]}