Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas
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Bibliographic Information
Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas
IEEE Computer Society, c1998
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1998 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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Includes bibliographical references and index
"IEEE Computer Society Press order number PR08832"
"IEEE order plan catalog number 98EX223"
Description and Table of Contents
Description
This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
by "Nielsen BookData"
