Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida

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Integrating photogrammetric techniques with scene analysis and machine vision III : 21-23 April, 1997, Orlando, Florida

David M. McKeown, Jr., J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, International Society for Photogrammetry and Remote Sensing

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3072）

SPIE, c1997

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Includes bibliographic references and author index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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