Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland

著者

• Pluta, Maksymilian
• Woliński, Tomasz R.
• Szyjer, Mariusz
• Society of Photo-optical Instrumentation Engineers. Poland Chapter
• Institute of Applied Optics (Poland)
• Komitet Badań Naukowych (Poland)
• Society of Photo-optical Instrumentation Engineers

書誌事項

Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland

Maksymilian Pluta, Tomasz R. Woliński, chairs/editors ; Mariusz Szyjer, co-editor ; organized by, SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3094）

SPIE, c1997

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA41023758
• ISBN:
  • 0819425095
• LCCN: 97200960
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: xviii, 374 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QC440
  • DC21 : 681/.25
• 件名:
  • LCSH : Polarization (Light) -- Congresses
  • LCSH : Polarimetry -- Congresses
  • LCSH : Ellipsometry -- Congresses
• 親書誌ID:
  • BA0022700X