Modern characterization methods of surfactant systems
著者
書誌事項
Modern characterization methods of surfactant systems
(Surfactant science series, v. 83)
M. Dekker, c1999
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Describes recent techniques applied to characterize surfactant systems, such as surfactant-stabilized colloids, micelles, microemulsions, emulsions and foams in both aqueous and nonaqueous fluids. The text probes adsorption and wetting phenomena at interfaces, including solid-liquid, liquid-vapour and liquid-liquid. It provides helpful examples and case studies illustrating how these techniques may be used in complementary ways.
目次
- Modern techniques employed for characterizing surfactant systems. Techniques involving microscopy: scanning tunneling microscopy at solid-liquid interfaces
- atomic force microscopy
- Brewster angle microscopy and ellipsometry
- cryogenic temperature transmission electron microscopy in the study of surfactant systems. Optical techniques: optical techniques for the characterization of monolayers and thin liquid films
- fluorescence and ESR spectroscopy
- studies of interactions between interfaces across surfactant solutions employing various surface force techniques
- non-linear optical techniques. Non-optical techniques: amphiphiles at interfaces studied by surface sensitive X-ray scattering
- neutron reflectivity at liquid-vapour, liquid-liquid, and solid-liquid interfaces
- quartz crystal microbalance
- electroacoustic studies of surfactant adsorption
- ultrasonic characterization of surfactant-containing systems.
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