Software defect and operational profile modeling

著者

• Cai, Kai-Yuan

書誌事項

Software defect and operational profile modeling

Kai-Yuan Cai

（The Kluwer international series in software engineering, 4）

Kluwer Academic Publishers, c1998

注記

Includes bibliographical references and index

内容説明・目次

内容説明

also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1

目次

Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Methods. 6. Neural Network Methods. 7. Software Defect Estimations Under Imperfect Debugging. 8. Software Operational Profile Modelling. 9. Modeling of Probably Zero-Defect Software. Index.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA41432382
• ISBN:
  • 0792382595
• LCCN: 98028057
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xix, 268 p.
• 大きさ: 25 cm
• 分類:
  • LCC : QA76.76.R44
  • DC21 : 005
• 件名:
  • LCSH : Computer software -- Reliability -- Mathematical models
  • LCSH : Computer software -- Quality control
• 親書誌ID:
  • BA26491422