ICMTS 1998, proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan

著者

書誌事項

ICMTS 1998, proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1998

  • : soft.
  • : case.

タイトル別名

98CH36157

大学図書館所蔵 件 / 全1件

この図書・雑誌をさがす

注記

"IEEE catalog number: 98CH36157"--T.p. verso

Includes bibliographical references and index

詳細情報

ページトップへ