ICMTS 1998, proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 1998, proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1998

• : soft.
• : case.

タイトル別名

98CH36157

注記

"IEEE catalog number: 98CH36157"--T.p. verso

Includes bibliographical references and index

• NII書誌ID(NCID): BA41658330
• ISBN:
  • 0780343484
  • 0780343492
• LCCN: 97080476
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: x, 240 p.
• 大きさ: 30 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815/48
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses