1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century

Author(s)

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• Institute of Electrical and Electronics Engineers. Los Angeles Council

Bibliographic Information

1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century

sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council

IEEE Service Center, c1998

• : soft.
• : case.

Other Title

1998 IEEE AUTOTESTCON

98CH36179

Note

"IEEE catalog no. 98CH36179"

Details

• NCID: BA41661175
• ISBN:
  • 0780344200
  • 0780344219
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, NJ
• Pages/Volumes: xxvi, 669 p.
• Size: 28 cm
• Classification:
  • LCC : TK7895.A8
  • DC20 : 620/.0044
• Subject Headings:
  • LCSH : Automatic checkout equipment -- Congresses
  • LCSH : Electronics in aeronatics -- Congresses
  • LCSH : Maintainabillty (Engineering) -- Congresses