1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century

著者

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• Institute of Electrical and Electronics Engineers. Los Angeles Council

書誌事項

1998 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference : test technology for the 21st century

sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council

IEEE Service Center, c1998

• : soft.
• : case.

タイトル別名

1998 IEEE AUTOTESTCON

98CH36179

注記

"IEEE catalog no. 98CH36179"

内容説明・目次

内容説明

This collection of papers discusses innovations in the aerospace industry. It includes topics such as: development process; commercial topics; AI-state; CTS(M); IFTE; JSF; testability analysis; software; international topics; commerce department; ATS design; SRU test; and integrated diagnosis.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA41661175
• ISBN:
  • 0780344200
  • 0780344219
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xxvi, 669 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.A8
  • DC20 : 620/.0044
• 件名:
  • LCSH : Automatic checkout equipment -- Congresses
  • LCSH : Electronics in aeronatics -- Congresses
  • LCSH : Maintainabillty (Engineering) -- Congresses