Analysis

著者

• European Congress on Electron Microscopy
• International Conference on X-ray Optics and Microanalysis
• Brederoo, P.
• Coslett, V.E.

書誌事項

Analysis

Editors P. Brederoo and V. E. Coslett

（Electron microscopy, 1980 : proceedings of the Seventh European Congress on Electron Microscopy, The Hague, The Netherlands, August 24-29, 1980, vol. 3）

Seventh European Congress on Electron Microscopy Foundation, 1980

注記

Including 9th International Conference on X-ray Optics and Microanalysis

EUREM 80

詳細情報

• NII書誌ID(NCID): BA42344156
• ISBN:
  • 9090001484
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Leiden
• ページ数/冊数: xxiii, 253 p.
• 大きさ: 27 cm
• 分類:
  • LCC : QH212.E4
  • DC19 : 502/.8/25
• 件名:
  • LCSH : Electron microscopy -- Congresses
• 親書誌ID:
  • BA0805659X