1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1999

• : soft.
• : case.

タイトル別名

99CH36296

注記

Includes bibliographies

"IEEE Catalog No. 99CH36296"

内容説明・目次

内容説明

This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA42467655
• ISBN:
  • 0780352203
  • 0780352211
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N. J.
• ページ数/冊数: vii, 448 p.
• 大きさ: 28 cm