1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999

Bibliographic Information

1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c1999

  • : soft.
  • : case.

Other Title

99CH36296

Available at  / 4 libraries

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Note

Includes bibliographies

"IEEE Catalog No. 99CH36296"

Description and Table of Contents

Description

This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.

by "Nielsen BookData"

Details

  • NCID
    BA42467655
  • ISBN
    • 0780352203
    • 0780352211
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, N. J.
  • Pages/Volumes
    vii, 448 p.
  • Size
    28 cm
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