Topics in electron diffraction and microscopy of materials
Author(s)
Bibliographic Information
Topics in electron diffraction and microscopy of materials
（Microscopy in materials science series）
Institute of Physics Pub., c1999
Available at / 20 libraries
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Institute of Materials and Systems for Sustainability, Nagoya University未来材料研
549.97||H41245795
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Note
Articles presented at a symposium held in Oxford on 18 September 1997 -- preface
Includes bibliographical references
Includes index
Description and Table of Contents
Description
Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.
The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
Table of Contents
Introduction (P B Hirsch). Early days of diffraction contrast transmission electron microscopy (P B Hirsch). Applications of weak-beam technique of electron microscopy (D J H Cockayne). 2-beam and 'n'-beam diffraction (A F Moodie). Pseudo aberration-free-focusing imaging method for atomic resolution electron microscopy of crystals (H Hashimoto). Probing atomic bonding using fast electrons (C J Humphreys and G A Botton). Interpretation of spatially resolved valence loss spectra (A Howie). Is molecular imaging possible? (J C H Spence et al). Diffraction imaging using backscattered electrons: fundamentals and applications (S L Dudarev). Development of dynamical theory of RHEED and applications to the in-situ monitoring of MBE growth (L-M Peng). Index
by "Nielsen BookData"
