X-ray characterization of materials
Author(s)
Bibliographic Information
X-ray characterization of materials
Wiley-VCH, c1999
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
This reference work on methods in materials characterization covers developments of the different X-ray analysis techniques as well as the fundamentals of X-ray characterization.
Table of Contents
- X-ray diffraction
- application of synchrotron X-radiation to problems in materials science
- X-ray fluorescence analysis
- small-angle scattering of X-rays and neutrons
- X-ray microscopy.
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