X-ray characterization of materials

著者

• Lifshin, Eric

書誌事項

X-ray characterization of materials

Eric Lifshin (ed.)

Wiley-VCH, c1999

注記

Includes bibliographical references and index

内容説明・目次

内容説明

This reference work on methods in materials characterization covers developments of the different X-ray analysis techniques as well as the fundamentals of X-ray characterization.

目次

• X-ray diffraction
• application of synchrotron X-radiation to problems in materials science
• X-ray fluorescence analysis
• small-angle scattering of X-rays and neutrons
• X-ray microscopy.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA42875866
• ISBN:
  • 3527296573
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Weinheim
• ページ数/冊数: xvi, 261 p
• 大きさ: 25 cm
• 分類:
  • DC21 : 620.11272
• 件名:
  • LCSH : X-rays -- Industrial applications
  • LCSH : Materials -- Analysis