Optical methods of measurement : wholefield techniques

書誌事項

Optical methods of measurement : wholefield techniques

Rajpal S. Sirohi, Fook Siong Chau

(Optical engineering, v. 65)

Marcel Dekker, c1999

この図書・雑誌をさがす
注記

Includes bibliographical references and index

内容説明・目次

内容説明

Provides an examination of up-to-date optical measurement techniques employing laser, holographic and digital technology. The text analyzes the most advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on practical and theoretical issues of reproducing extremely fine spatial resolution in two and three dimensions.

目次

  • Waves
  • deffraction
  • phase evaluation methods
  • detectors and recording materials
  • holographic interferometry
  • speckle metrology
  • photoelasticity
  • the Moire phenomenon

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詳細情報
  • NII書誌ID(NCID)
    BA42956323
  • ISBN
    • 0824760034
  • LCCN
    99015000
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    New York
  • ページ数/冊数
    xiv, 323 p.
  • 大きさ
    24 cm
  • 分類
  • 件名
  • 親書誌ID
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