Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

著者

• Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
• Rai-Choudhury, P.
• Electrochemical Society. Electronics Division

書誌事項

Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices

editors, P. Rai-Choudhury ... [et al.]

（Proceedings / [Electrochemical Society], v. 97-12）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3322）

Electrochemical Society, c1997

タイトル別名

Diagnostic techniques for semiconductor materials and devices

注記

"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering."

Includes bibliographical references and indexes

"SPIE Volume 3322; ISBN 0-8194-2765-9"

"ECS PV 97-12; ISBN 1-56677-139-0"

詳細情報

• NII書誌ID(NCID): BA4312851X
• ISBN:
  • 0819427659
  • 1566771390
• LCCN: 98158684
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: ix, 478 p.
• 大きさ: 23 cm
• 分類:
  • LCC : TK7871.85
  • DC21 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Testing -- Congresses
• 親書誌ID:
  • BA01323290
  • BA0022700X