Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 20-22, 1997, Paris, France

Bibliographic Information

Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 20-22, 1997, Paris, France

sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing

IEEE Computer Society Press, c1997

  • : pbk.
  • : microfiche

Other Title

97TB100189

Available at  / 2 libraries

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Note

Includes bibliographical references and index

"IEEE catalog number 97TB100189"

Description and Table of Contents

Description

Papers from the 1997 IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems.

by "Nielsen BookData"

Details

  • NCID
    BA43520028
  • ISBN
    • 0818681683
    • 0818681705
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Los Alamitos, CA. ; Tokyo
  • Pages/Volumes
    xi,314 p.
  • Size
    23 cm
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