Proceedings of the Third International Symposium on Defects in Silicon

著者

• International Symposium on Defects in Silicon
• Abe, T. (Takeo)
• Electrochemical Society. Electronics Division
• Electrochemical Society. Meeting

書誌事項

Proceedings of the Third International Symposium on Defects in Silicon

editors, T. Abe ... [et al.]

（Proceedings / [Electrochemical Society], v. 99-1）

Electrochemical Society, c1999

タイトル別名

Defects in silicon III

注記

"Electronics Divisions."

Papers presented during the 195th Meeting of the Electrochemical Society, May 2-7, 1999, in Seattle, Wash

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA4370711X
• ISBN:
  • 1566772230
• LCCN: 99061470
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ
• ページ数/冊数: ix, 530 p.
• 大きさ: 24 cm
• 分類:
  • LCC : QC611.8.S5
  • DC21 : 621.3815/2
• 件名:
  • LCSH : Silicon -- Defects Congresses
  • LCSH : Semiconductors -- Defects Congresses
• 親書誌ID:
  • BA01323290