X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California

著者

• Fineschi, Silvano
• Society of Photo-optical Instrumentation Engineers

書誌事項

X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California

Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3443）

SPIE, c1998

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA44159971
• ISBN:
  • 0819428981
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: v, 160 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QB468
  • DC20 : 522/.65
• 件名:
  • LCSH : Polarimetry -- Congresses
  • LCSH : X-ray astronomy -- Instruments -- Congresses
  • LCSH : Ultraviolet astronomy -- Instruments -- Congresses
• 親書誌ID:
  • BA0022700X