Proceedings : the 1980 Canadian Reliability Symposium, May 16-17, 1980, Toronto, Ontario, Canada

著者

• Canadian S.R.E. Reliability Symposium
• Lewis, David Neville
• Society of Reliability Engineers. Canadian Chapter

書誌事項

Proceedings : the 1980 Canadian Reliability Symposium, May 16-17, 1980, Toronto, Ontario, Canada

Neville Lewis, chairman

（Microelectronics and reliability, v. 20, no. 1/2）

Pergamon Press, c1980

注記

"Sponsored by the Canadian Chapter of the Society of Reliability Engineers"--T.p. verso

• NII書誌ID(NCID): BA44306464
• ISBN:
  • 0080261639
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Oxford
• ページ数/冊数: 167 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA28297566