Thematic test analysis

著者

• Shneidman, Edwin S.
• Joel, Walther
• Little, Kenneth B.

書誌事項

Thematic test analysis

Edwin S. Shneidman ; with the collaboration of Walther Joel, Kenneth B. Little ; foreword by Henry A. Murray

[UT Back-in-Print Service], 1951

注記

Reprint. Originally published: New York : Grune & Stratton, 1951

Includes bibliographical references and index

"The UT Back-in-Print Service is represented in Japan by Maruzen Company, Limited"--Half t.p

詳細情報

• NII書誌ID(NCID): BA44450904
• 出版国コード: cn
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Toronto]
• ページ数/冊数: xi, 320 p.
• 大きさ: 27 cm