Analysis on in-service failures and advances in microstructural characterization : proceedings of the thirty first Annual Technical Meeting of the International Metallographic Society
著者
書誌事項
Analysis on in-service failures and advances in microstructural characterization : proceedings of the thirty first Annual Technical Meeting of the International Metallographic Society
（Microstructural science, v. 26）
International Metallographic Society , ASM International, c1999
- タイトル別名
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31st Annual International Metallographic Soceity (IMS) Convention
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注記
Meeting held July 26-29, 1998 in Ottawa, Canada
Includes bibliographical references
内容説明・目次
内容説明
(Microstructural Science Vol. 26). Proceedings from the 31st Annual International Metallographic Society (IMS) Convention, held 26-29 July 1998 in Ottawa, Ontario, Canada. Contents: Analysis of In-Service Failures (tutorials, transportation industry, corrosion and materials degradation, electronic and advanced materials) 1998 Sorby Award Lecture by Kay Geels, Struers A/S ('Metallographic Preparation from Sorby to the Present') Advances in Microstructural Characterization (characterization techniques using high resolution and focused ion beam, characterization of microstructural clustering and correlation with performance) Advanced Applications (advanced alloys and intermetallic compounds, plasma spray coatings and other surface coatings, corrosion, and materials degradation).
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