The examination of residuals for the detection of specification errors

著者

• Gipe, George Walter

書誌事項

The examination of residuals for the detection of specification errors

by George Walter Gipe

University Microfilms, c1973

注記

Microfilm/Xerographic. Reprint of author's thesis (Ph.D.)--University of Oregon, 1972

Includes bibliographical references (l. 76-79)

詳細情報

• NII書誌ID(NCID): BA45121351
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Ann Arbor, Mich.
• ページ数/冊数: x, 79 l.
• 大きさ: 21 cm