ICMTS 1999, proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures, March 15-18, 1999, Göteborg, Sweden

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 1999, proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures, March 15-18, 1999, Göteborg, Sweden

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c1999

• : soft.
• : case.

タイトル別名

99CH36307

注記

"IEEE catalog number: 99CH36307"--T.p. verso

Includes bibliographical references and index

• NII書誌ID(NCID): BA45240791
• ISBN:
  • 078035270X
  • 0780352718
• LCCN: 98089942
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: ix, 235 p.
• 大きさ: 29 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815/48
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses