1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium

著者

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• Institute of Electrical and Electronics Engineers. Central Texas Section

書誌事項

1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium

sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Central Texas Section

IEEE Service Center, c1999

• : soft.
• : case.

タイトル別名

1999 IEEE AUTOTESTCON

AUTOTESTCON 99

99CH36323

注記

"IEEE catalog no. 99CH36323"

• NII書誌ID(NCID): BA45434437
• ISBN:
  • 078035432X
  • 0780354338
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xxix, 830 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7895.A8
  • DC20 : 620/.0044
• 件名:
  • LCSH : Automatic checkout equipment -- Congresses
  • LCSH : Electronics in aeronatics -- Congresses
  • LCSH : Maintainabillty (Engineering) -- Congresses