Industrial applications of X-ray diffraction
著者
書誌事項
Industrial applications of X-ray diffraction
Marcel Dekker, c2000
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.
目次
- Part 1 Introduction: the principles of diffraction analysis
- the practice of diffraction analysis
- progress and potential x-ray diffraction. Part 2 Industrial applications - high tech: semiconductors - integrated circuit manufacture
- superconductors -structures and applications
- aerospace - the aircraft gas turbine industry
- automotive - selected cases of applications
- petroleum exploration and production
- petroleum and petrochemicals
- petrochemicals - catalysts in refineries
- petrochemicals -vitality of catalysts research. Part 3 Metals: hydrometallurgy
- x-ray fractography. Part 4 Minerals and ceramics: mining -exploration and process control
- mining - mineral ores and products
- cement - quantitative phase analysis of Portland cement clinker
- silica
- glass-ceramics. Part 5 Polymers and composites: polymer industry
- paint and pigment industry
- pharmaceuticals -development and formulation
- pharmaceuticals - design and development of drug delivery systems. Part 6 Chemicals: energy -by-products of coal combustion in power plants
- lighting - design and development of luminescent materials
- photography - image capture and image storage materials
- detergents and cleansers -phase analysis of sodium phosphates
- museum - art and archaeology
- forensic science - every contact leaves a trace
- US Customs laboratories
- commercial service laboratory. Part 7 Specialty techniques - radiations: synchrotron usage by industry
- electron microscopy in industry. Part 8 Microstructures and instrumentation: line profile and sample microstructure
- thin films and multilayers
- residual stress and stress gradients
- residual stress development and texture formation during rolling contact loading
- Warren-Averbach applications
- microbeam crystallographic and elemental analysis
- high temperature and non-ambient x-ray diffraction. Part 9 Diffraction patterns: NIST standard reference materials for characterization of instrument performance
- grain orientation and texture
- structure analysis from powder data.
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