Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida
著者
書誌事項
Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 3375)
SPIE, c1998
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Divided into four parts, this text covers the areas of model evaluation and signature measurement issues; target and background modelling; target acquisition issues; and dual sensor systems.
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