Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida

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書誌事項

Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida

Wendell R. Watkins, Dieter Clement, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3375）

SPIE, c1998

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

Divided into four parts, this text covers the areas of model evaluation and signature measurement issues; target and background modelling; target acquisition issues; and dual sensor systems.

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