Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

Author(s)

• Fineschi, Silvano
• Woodgate, Bruce
• Kimble, Randy Alan
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado

Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3764）

SPIE, c1999

Note

Includes bibliographical references and index

Details

• NCID: BA45717599
• ISBN:
  • 0819432504
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 288 p.
• Size: 28 cm
• Classification:
  • LCC : QB468
  • DC20 : 522/.65
• Subject Headings:
  • LCSH : Polarimetry -- Congresses
  • LCSH : X-ray astronomy -- Instruments -- Congresses
  • LCSH : Ultraviolet astronomy -- Instruments -- Congresses
• Parent Bibliography ID:
  • BA0022700X